ICM 2015 - 27th International Conference on Microelectronics



Patrick Girard

Keynote Title : Test of Low Power Devices  « Constraints and Industrial Practices »

Patrick GIRARD received a M.Sc. degree in Electrical Engineering and a Ph.D. degree in Microelectronics from the University of Montpellier, France, in 1988 and 1992 respectively. He is currently Research Director at CNRS (French National Center for Scientific Research) and works in the Microelectronics Department of the Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM) – France. He is co-Director of the International Associated Laboratory « LAFISI » (French-Italian Research Laboratory on Hardware-Software Integrated Systems) created in 2013 by the CNRS and the University of Montpellier 2 with the Politecnico di Torino, Italy. From 2010 to 2014, he was head of the Microelectronics Department of LIRMM. His research interests include all aspects of digital testing and memory testing, with emphasis on critical constraints such as timing and power. Reliability and fault tolerance are also part of his research activities. He is Technical Activities Chair of the Test Technology Technical Council (TTTC) of the IEEE Computer Society. From 2006 to 2010, he was Vice-Chair of the European TTTC (ETTTC) of the IEEE Computer Society. He has served on numerous conference committees and is the founder and Editor-in-Chief of the ASP Journal of Low Power Electronics (JOLPE). He is also an Associate Editor of the IEEE Transactions on Computers, IEEE Transactions on CAD and the Journal of Electronic Testing – Theory and Applications (JETTA – Springer). He has supervised 33 PhD dissertations and has published 6 books or book chapters, 60 journal papers, and more than 200 conference and symposium papers on these fields. Patrick Girard is a Fellow of IEEE and a Golden Core Member of the IEEE Computer Society.


Jean-Michel Sallese

Keynote Title : Principle of Junctionless Field Effect Transistors

Jean-Michel Sallese is currently appointed Maître d’Enseignement et de Recherche at the Ecole Polytechnique Fédérale de Lausanne, Switzerland. After obtaining the PhD in physics from the university of Nice-Sophia Antipolis in 1991 (CNRS), he joined the EPFL where he started working on semiconductor lasers and diffusion in highly confined systems. Next, his research activities focused on the so-called EKV model, giving it its recent physics based foundations which core relationships are now implemented in the BSIM6 model. Next, he developed different charge based models for emerging field effect electron devices, and in particular for the so-called multigate gate FETs and junction-less FETs, while still maintaining strong links with physics. Besides, he proposed a novel concept of enhanced diodes and resistances to model minority carriers generation and propagation in silicon substrates for smart power applications, including EDS prediction. More recently, bio-sensors fabricated in CMOS technology became part of his activities with a new concept of bio-sensor in SOI technology which is under development. Jean-Michel Sallese is currently giving lectures on modelling emerging semiconductor devices as well as in silicon technology dedicated to integrated circuits. He was also lecturing in the framework of the IDESA courses (EC project) from 2008 to 2012.


Hicham Bouzekri

Keynote Title : Microelectronics in Morocco « Lessons learned & perspectives »

Hicham Bouzekri received his Engineer diploma in electronics and communications from the Ecole Mohammadia d’Ingénieurs in 1995. After two years working as a microelectronics industrial process engineer for SGS-Thomson in Casablanca, he was awarded a Fulbright scholarship in 1997 to join the Master’s of Science program of the University of Florida, Gainesville from which he graduated in 1998. He obtained a Ph.D. from Texas A&M University, College Station in 2002. After graduating, he was among the pioneers who started STMicroelectronics’ Rabat Integrated Circuit Design center, a first in Africa. He held several management positions within STM and ST-Ericsson while concurrently holding an adjunct faculty position at Al Akhawayn University. He served as ST-Ericsson representative at USB-IF Board of Directors and as their representative in MIPI – Technical Steering Group and MIPI-Unipro workgroup vice-chair. He has co-authored a number of scientific publications and industry standards in wireless communications over the span of his 19 years of experience and was elected as an IEEE senior member. After several years of successful leadership in driving innovative ecosystems involving industries and universities in Morocco, he co-founded and currently serves as the president of the Morocco Microelectronics Cluster, a government backed non-for-profit Industry-Academic consortium. In 2013, he joined Mascir management team, a Moroccan non for profit foundation conducting market oriented R&D in Microelectronics, Biotechnology & Nano-materials. He currently serves as its Chief Executive Officer



Tutorial #1
Emmanuel Simeu
Tutorial Title: Indirect Test and Control of Analogue/RF Circuits
Abstract: Testing high-performance AMS and RF circuits embedded in complex integrated systems and ensuring high test quality at low cost for these AMS and RF designs has become a challenging task. The complexity of AMS and RF cores, together with shrinking device dimensions limit accessibility to the internal nodes of the circuits. The objective of this tutorial is to present recent research developments in the field of BIST, monitoring and adaptation for RF and AMS circuits. Special attention will be paid to new approaches for controlling and adapting the performances of IPs embedded in SoC or SiP. In particular for efficient management of performances and energy in battery-operated power hungry devices as the radio frequency (RF). In fact, for each device, parameter variability, ageing mechanisms and operation disturbances can make difficult to guarantee the required performance level while only one power supply is applied. New research directions are focusing on the development of embedded test instruments providing indirect measurement metrics that are used to include, power management, ageing and reliability monitoring, defect coverage, yield recovering, diagnosis capabilities, etc.
Speaker’s Biography: Emmanuel Simeu received the electrical engineer diploma in 1987 from Hassania School of engineering of Casablanca, Master and the PhD degrees in Automatic Control and System Theory from the INPG (Institut National Polytechnique de Grenoble) in 1988 and 1992 respectively. From 1989 to 1992 he was researcher in CNET France Telecom research centre. He is currently associate professor in energetic and automatic control at UGA (Université Grenoble Alpes). He is the group leader of the researcher team RMS (Reliable Mixed-signal Systems) in TIMA laboratory of Grenoble. He has been involved in nonlinear systems modelling and control. His current field of research includes heterogeneous system modelling, reliability of embedded systems, diagnosis and control of analogue/RF circuits.
Tutorial #2
Khaled Nabil Salama
Tutorial Title: Future computing systems: The case for memristors
Abstract: Current CMOS-Based technologies are facing design challenges related to the continuous scaling down of minimum feature size according to Moore’s law. Moreover, the conventional computing architecture is no more an effectual way to fulfill modern applications demands, such as big data analysis, pattern recognition, and vector processing. Therefore, there is an exigent need to shift to new technologies, at both the architecture and the device levels. Recently, memristor devices and structures attracted attention for being promising candidates for this job. Memristor device adds a new dimension for designing novel circuits and systems. In addition, high-density memristor-based crossbar is widely considered to be the essential element for future memory and bio-inspired computing systems. However, there are numerous challenges that need to be addressed before the memristor genuinely replaces current memory and computing technologies, which is the motivation behind this research effort. Altogether, we believe that our contributions to the emerging technology help in pushing it to a next level and shortened the way for a much better futuristic computing systems.
Speaker’s Biography: Khaled Nabil Salama received the B.S. degree (with honors) from the Department Electronics and Communications, Cairo University, Cairo, Egypt, in 1997, and the M.S. and Ph.D. degrees from the Department of Electrical Engineering, Stanford University, Stanford, CA, USA, in 2000 and 2005, respectively. He was an Asistant Professor at Rensselaer Polytechnic Institute, NY, USA, between 2005 and 2009. He joined King Abdullah University of Science and Technology in January 2009 and was the founding Program Chair until August 2011. His work on CMOS sensors for molecular detection has been funded by the National Institutes of Health (NIH) and the Defense Advanced Research Projects Agency (DARPA), awarded the Stanford– Berkeley Innovators Challenge Award in biological sciences and was acquired by Lumina Inc. He is the author of 120 papers and eight patents on low-power mixed-signal circuits for intelligent fully integrated sensors and nonlinear electronics specially memristor devices.


Tutorial #3
Otmane Ait Mohamed
Tutorial Title: Hardware Verification: Challenges & New Trends
Abstract: The increasing popularity of System-on-Chip (SoC) circuits results in many new challenges. One major challenge is to ensure the functional correctness of such complicated circuits. Coverage Directed Test Generation (CDTG) is an essential part of functional verification, where the objective is to generate input stimulus that maximize the coverage of a design. Coverage helps to determine how well the input stimulus verified the design under verification. CDTG techniques analyze coverage results and adapt the input stimulus generation process to improve the coverage. In this tutorial, we will give a general introduction to verification of complex digital systems, define the various validation techniques, and focus on CDTG validation procedure. We will introduce the main concept of SystemVerilog language, which is gaining a lot in popularity within CAD community.
Speaker’s Biography: Ait-Mohamed has been working on formal verification for hardware and communication protocols since 1992. He contributed to the MDG tool, a first order Model checking tool developped at the university of Montreal. He worked at Cistel Technology, then Nortel Networks as a senior verification engineer where he introduced the use of formal method techniques in the hardware design flow to identify critical issues in the protocols used in Nortel’s Virtual Processor Subsystems. His work with the verification team consisted of verifying four different ASICs used in Nortel’s communication data switch. His main research areas include Model Checking, assertion based verification, automatic test generations, and FPGA- based design and verification, Reliability Analysis for Avionics Systems. He is a member of IEEE and ACM. He is a registered professional engineer with the Ordre des ingénieurs du Québec.


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